Impact of Resistive-Bridge Defects in TAS-MRAM Architectures

J. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay. Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 125-130, IEEE Computer Society, 2012. [doi]

Abstract

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