Impact of resistive-open defects on the heat current of TAS-MRAM architectures

J. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay. Impact of resistive-open defects on the heat current of TAS-MRAM architectures. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 532-537, IEEE, 2012. [doi]

Abstract

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