Hassen Aziza, Haithem Ayari, Santhosh Onkaraiah, Jean Michel Portal, Mathieu Moreau, Marc Bocquet. Oxide based resistive RAM: ON/OFF resistance analysis versus circuit variability. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 81-85, IEEE, 2014. [doi]
Abstract is missing.