George K. Baah, Andy Podgurski, Mary Jean Harrold. Causal inference for statistical fault localization. In Paolo Tonella, Alessandro Orso, editors, Proceedings of the Nineteenth International Symposium on Software Testing and Analysis, ISSTA 2010, Trento, Italy, July 12-16, 2010. pages 73-84, ACM, 2010. [doi]
Abstract is missing.