A study of RF oscillator reliability in nanoscale CMOS

Masoud Babaie, Robert Bogdan Staszewski. A study of RF oscillator reliability in nanoscale CMOS. In 21st European Conference on Circuit Theory and Design, ECCTD 2013, Dresden, Germany, September 8-12, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.