Optimising the Selected Neighbourhood for Yield Mapping by Comparing Plot and Monitor Yield Values

Martin Bachmeier. Optimising the Selected Neighbourhood for Yield Mapping by Comparing Plot and Monitor Yield Values. In Armin B. Cremers, Rainer Manthey, Peter Martini, Volker Steinhage, editors, INFORMATIK 2005 - Informatik LIVE! Band 1, Beiträge der 35. Jahrestagung der Gesellschaft für Informatik e.V. (GI), Bonn, 19. bis 22. September 2005. Volume 67 of LNI, pages 360-364, GI, 2005.

Abstract

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