Swapnil Bahl. A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller. In 12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA. pages 78-83, IEEE Computer Society, 2004. [doi]
@inproceedings{Bahl04,
title = {A Novel Method for Silicon Configurable Test Flow and Algorithms for Testing, Debugging and Characterizing Different Types of Embedded Memories through a Shared Controller},
author = {Swapnil Bahl},
year = {2004},
doi = {10.1109/MTDT.2004.2},
url = {http://doi.ieeecomputersociety.org/10.1109/MTDT.2004.2},
tags = {testing, data-flow, debugging},
researchr = {https://researchr.org/publication/Bahl04},
cites = {0},
citedby = {0},
pages = {78-83},
booktitle = {12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2193-2},
}