Sudarshan Bahukudumbi, Krishnendu Chakrabarty. Test-Pattern Ordering for Wafer-Level Test-During-Burn-In. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 193-198, IEEE Computer Society, 2008. [doi]
Abstract is missing.