Sudarshan Bahukudumbi, Sule Ozev, Krishnendu Chakrabarty, Vikram Iyengar. Wafer-Level Defect Screening for Big-D/Small-A Mixed-Signal SoCs. IEEE Trans. VLSI Syst., 17(4):587-592, 2009. [doi]
@article{BahukudumbiOCI09,
title = {Wafer-Level Defect Screening for Big-D/Small-A Mixed-Signal SoCs},
author = {Sudarshan Bahukudumbi and Sule Ozev and Krishnendu Chakrabarty and Vikram Iyengar},
year = {2009},
doi = {10.1109/TVLSI.2008.2006075},
url = {http://dx.doi.org/10.1109/TVLSI.2008.2006075},
researchr = {https://researchr.org/publication/BahukudumbiOCI09},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {17},
number = {4},
pages = {587-592},
}