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Plug & Play I::DDQ:: Monitoring with QTAG

Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen. Plug & Play I::DDQ:: Monitoring with QTAG. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 739-749, IEEE Computer Society, 1995.

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