Raghuraman Balasubramanian, Karthikeyan Sankaralingam. Understanding the impact of gate-level physical reliability effects on whole program execution. In 20th IEEE International Symposium on High Performance Computer Architecture, HPCA 2014, Orlando, FL, USA, February 15-19, 2014. pages 60-71, IEEE, 2014. [doi]
Abstract is missing.