True Random Number Generation by Variability of Resistive Switching in Oxide-Based Devices

Simone Balatti, Stefano Ambrogio, Zhongqiang Wang, Daniele Ielmini. True Random Number Generation by Variability of Resistive Switching in Oxide-Based Devices. IEEE J. Emerg. Sel. Topics Circuits Syst., 5(2):214-221, 2015. [doi]

Abstract

Abstract is missing.