Marco Balboni, Davide Bertozzi. Transparent lifetime built-in self-testing of networks-on-chip through the selective non-concurrent testing of their communication channels. In Sören Sonntag, José Manuel García Carrasco, José Luis Abellán Miguel, Daniel Müller-Gritschneder, editors, Proceedings of the 2nd International Workshop on Advanced Interconnect Solutions and Technologies for Emerging Computing Systems, AISTECS@HiPEAC 2017, Stockholm, Sweden, January 25, 2017. pages 12-17, ACM, 2017. [doi]
Abstract is missing.