Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell. Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electronic Testing, 23(6):497-512, 2007. [doi]

Abstract

Abstract is missing.