Nilanjan Banerjee, Charles Augustine, Kaushik Roy. Fault-Tolerance with Graceful Degradation in Quality: A Design Methodology and Its Application to Digital Signal Processing Systems. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 323-331, IEEE Computer Society, 2008. [doi]
Abstract is missing.