Computer Aided Test (CAT) Tool for Mixed Signal SOCs

Shibaji Banerjee, Debdeep Mukhopadhyay, Dipanwita Roy Chowdhury. Computer Aided Test (CAT) Tool for Mixed Signal SOCs. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 787-790, IEEE Computer Society, 2005. [doi]

Abstract

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