A self optimizing autofocusing scheme for microscope integrated visual inspection systems

Eray A. Baran, Orhan Ayit, Victor B. Santiago, Sergio Lopez-Doriga, Asif Sabanovic. A self optimizing autofocusing scheme for microscope integrated visual inspection systems. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 4043-4048, IEEE, 2013. [doi]

Abstract

Abstract is missing.