Rafal Baranowski, Alejandro Cook, Michael E. Imhof, Chang Liu, Hans-Joachim Wunderlich. Synthesis of workload monitors for on-line stress prediction. In 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2013, New York City, NY, USA, October 2-4, 2013. pages 137-142, IEEE, 2013. [doi]
No references recorded for this publication.
No citations of this publication recorded.