Modeling, verification and pattern generation for reconfigurable scan networks

Rafal Baranowski, Michael A. Kochte, Hans-Joachim Wunderlich. Modeling, verification and pattern generation for reconfigurable scan networks. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-9, IEEE Computer Society, 2012. [doi]

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