Deepak Baranwal, Digvijay Singh, Khanusiya Soyeb, Sidhartha Sankar Rout, Sujay Deb. Reliability Enhancement of SoCs Based on Dynamic Memory Access Profiling in Conjunction with PVT Monitoring. In 28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015. pages 541-546, IEEE Computer Society, 2015. [doi]
Abstract is missing.