Linda M. Barclay, Roderick S. Barclay. Risk Analysis Of Critical Control Points in the Life Cycle of SMF Information. In George W. Dodson, J. William Mullen, Linda J. Carroll, Dave Parker, Carole Arruda Reed, Harry Zimmer, Carolyn Hanna, Doug McBride, Bob Miller, Dave Thorn, Ellen E. Robertson, Bob Bishop, Ellen M. Friedman, Chuck Hopf, Jerry L. Rosenberg, John P. Pilch, editors, 15th International Computer Measurement Group Conference, Reno, Nevada, USA, December 11-15, 1989, Proceedings. pages 1211-1219, Computer Measurement Group, 1989.
Abstract is missing.