Transient latch-up: experimental analysis and device simulation

S. Bargstädt-Franke, Wolfgang Stadler, K. Esmark, M. Streibl, K. Domanski, Horst A. Gieser, Heinrich Wolf, W. Bala. Transient latch-up: experimental analysis and device simulation. Microelectronics Reliability, 45(2):297-304, 2005. [doi]

Abstract

Abstract is missing.