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New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions

D. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner. New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability, 46(9-11):1772-1777, 2006. [doi]

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