Carl Barnhart, Vanessa Brunkhorst, Frank Distler, Owen Farnsworth, Andrew Ferko, Brion L. Keller, David Scott, Bernd Könemann, Takeshi Onodera. Extending OPMISR beyond 10x Scan Test Efficiency. IEEE Design & Test of Computers, 19(5):65-72, 2002. [doi]
Abstract is missing.