Thomas Bartenstein. Fault distinguishing pattern generation. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 820-828, IEEE Computer Society, 2000.
@inproceedings{Bartenstein00,
title = {Fault distinguishing pattern generation},
author = {Thomas Bartenstein},
year = {2000},
researchr = {https://researchr.org/publication/Bartenstein00},
cites = {0},
citedby = {0},
pages = {820-828},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}