Reliability evaluation of a silicon-on-silicon MCM-D package

J. Barton, G. McCarthy, R. Doyle, K. Delaney, Enric Cabruja, M. Lozano, A. Collado, J. Santander. Reliability evaluation of a silicon-on-silicon MCM-D package. Microelectronics Reliability, 41(6):887-899, 2001. [doi]

Abstract

Abstract is missing.