Pavel Bartos, Zdenek Kotásek, Jan Dohnal. Decreasing test time by scan chain reorganization. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 371-374, IEEE, 2011. [doi]
Abstract is missing.