Philippe Basset, Gabriele Saucier. Top down design and testability of VLSI circuits. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 851-857, ACM/IEEE, 1982. [doi]
Abstract is missing.