A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults

R. Possamai Bastos, F. Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre. A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. In 2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Karlsruhe, Germany, September 9-11, 2013. pages 157-163, IEEE, 2013. [doi]

Abstract

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