R. Possamai Bastos, F. Sill Torres, Jean-Max Dutertre, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre. A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults. In 2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Karlsruhe, Germany, September 9-11, 2013. pages 157-163, IEEE, 2013. [doi]
@inproceedings{BastosTDFNR13-0,
title = {A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults},
author = {R. Possamai Bastos and F. Sill Torres and Jean-Max Dutertre and Marie-Lise Flottes and Giorgio Di Natale and Bruno Rouzeyre},
year = {2013},
doi = {10.1109/PATMOS.2013.6662169},
url = {http://dx.doi.org/10.1109/PATMOS.2013.6662169},
researchr = {https://researchr.org/publication/BastosTDFNR13-0},
cites = {0},
citedby = {0},
pages = {157-163},
booktitle = {2013 23rd International Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS), Karlsruhe, Germany, September 9-11, 2013},
publisher = {IEEE},
}