Pseudo Random Patterns Using Markov Sources for Scan BIST

Nadir Z. Basturkmen, Sudhakar M. Reddy, Irith Pomeranz. Pseudo Random Patterns Using Markov Sources for Scan BIST. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 1013-1021, IEEE Computer Society, 2002. [doi]

Abstract

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