Kanad Basu, Prabhat Mishra, Priyadarsan Patra. Observability-aware Directed Test Generation for Soft Errors and Crosstalk Faults. In 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, Pune, India, January 5-10, 2013. pages 291-296, IEEE, 2013. [doi]
Abstract is missing.