Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel. Towards a Safe Use of Design Patterns to Improve OO Software Testability. In 12th International Symposium on Software Reliability Engineering (ISSRE 2001), 27-30 November 2001, Hong Kong, China. pages 324-331, IEEE Computer Society, 2001. [doi]
Abstract is missing.