Measuring and Improving Design Patterns Testability

Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel. Measuring and Improving Design Patterns Testability. In 9th IEEE International Software Metrics Symposium (METRICS 2003), 3-5 September 2003, Sydney, Australia. pages 50, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.