An Analysis of I/O And Syscalls In Critical Sections And Their Implications For Transactional Memory

Lee Baugh, Craig B. Zilles. An Analysis of I/O And Syscalls In Critical Sections And Their Implications For Transactional Memory. In IEEE International Symposium on Performance Analysis of Systems and Software, ISPASS 2008, April 20-22, 2008, Austin, Texas, USA, Proceedings. pages 54-62, IEEE, 2008. [doi]

Abstract

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