Cross-validation Confidence Intervals for Test Error

Pierre Bayle, Alexandre Bayle, Lucas Janson, Lester Mackey. Cross-validation Confidence Intervals for Test Error. In Hugo Larochelle, Marc'Aurelio Ranzato, Raia Hadsell, Maria-Florina Balcan, Hsuan-Tien Lin, editors, Advances in Neural Information Processing Systems 33: Annual Conference on Neural Information Processing Systems 2020, NeurIPS 2020, December 6-12, 2020, virtual. 2020. [doi]

No reviews for this publication, yet.