Ismet Bayraktaroglu, Alex Orailoglu. Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 113-120, IEEE Computer Society, 2003. [doi]
Abstract is missing.