A physical approach on SCOBIC investigation in VLSI

T. BeauchĂȘne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto. A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability, 43(1):173-177, 2003. [doi]

Abstract

Abstract is missing.