Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press. Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 223-228, IEEE Computer Society, 2005. [doi]
Abstract is missing.