Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich. Massive statistical process variations: A grand challenge for testing nanoelectronic circuits. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2010), Chicago, Illinois, USA, June 28 - July 1, 2010. pages 95-100, IEEE, 2010. [doi]
Abstract is missing.