Thales E. Becker, Fábio Fedrizzi Vidor, Gilson I. Wirth, Thorsten Meyers, Julia Reker, Ulrich Hilleringmann. Time domain electrical characterization in zinc oxide nanoparticle thin-film transistors. In 19th IEEE Latin-American Test Symposium, LATS 2018, Sao Paulo, Brazil, March 12-14, 2018. pages 1-6, IEEE, 2018. [doi]
Abstract is missing.