Cryogenic characterization of 28 nm bulk CMOS technology for quantum computing

Arnout Beckers, Farzan Jazaeri, Andrea Ruffino, Claudio Bruschini, Andrea Baschirotto, Christian Enz. Cryogenic characterization of 28 nm bulk CMOS technology for quantum computing. In 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017. pages 62-65, IEEE, 2017. [doi]

Abstract

Abstract is missing.