Simon Van Beek, Adrian Vaisman Chasin, Subhali Subhechha, Harold Dekkers, Nouredine Rassoul, Yiqun Wan, Hongwei Tang, Joao P. Bastos, Attilio Belmonte, Gouri Sankar Kar. Dielectric Breakdown Analysis on Bottom and Top-Gated IGZO-TFT. In IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025. pages 1-7, IEEE, 2025. [doi]
Abstract is missing.