Do Stuck Fault Models Reflect Manufacturing Defects?

C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku. Do Stuck Fault Models Reflect Manufacturing Defects?. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 35-42, IEEE Computer Society, 1982.

Abstract

Abstract is missing.