Ralf Behnke, Jakob Salzmann, Stephan Simanowski, Dirk Timmermann. Efficient Localized Detection of Erroneous Nodes (ELDEN). In 10th IEEE International Conference on Computer and Information Technology, CIT 2010, Bradford, West Yorkshire, UK, June 29-July 1, 2010. pages 2884-2890, IEEE Computer Society, 2010. [doi]
Abstract is missing.