Dimitris Bekiaris, Antonis Papanikolaou, Christos Papameletis, Dimitrios Soudris, George Economakos, Kiamal Z. Pekmestzi. A Temperature-Aware Time-Dependent Dielectric Breakdown Analysis Framework. In René van Leuken, Gilles Sicard, editors, Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation - 20th International Workshop, PATMOS 2010, Grenoble, France, September 7-10, 2010, Revised Selected Papers. Volume 6448 of Lecture Notes in Computer Science, pages 73-83, Springer, 2010. [doi]
Abstract is missing.