Performance drifts of N-MOSFETs under pulsed RF life test

M. A. Belaïd, M. Gares, K. Daoud, Olivier Latry. Performance drifts of N-MOSFETs under pulsed RF life test. Microelectronics Reliability, 54(9-10):1851-1855, 2014. [doi]

Abstract

Abstract is missing.