Performance drifts of N-MOSFETs under pulsed RF life test

M. A. Belaïd, M. Gares, K. Daoud, Olivier Latry. Performance drifts of N-MOSFETs under pulsed RF life test. Microelectronics Reliability, 54(9-10):1851-1855, 2014. [doi]

Authors

M. A. Belaïd

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M. Gares

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K. Daoud

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Olivier Latry

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