M. A. Belaïd, M. Gares, K. Daoud, Olivier Latry. Performance drifts of N-MOSFETs under pulsed RF life test. Microelectronics Reliability, 54(9-10):1851-1855, 2014. [doi]
@article{BelaidGDL14,
title = {Performance drifts of N-MOSFETs under pulsed RF life test},
author = {M. A. Belaïd and M. Gares and K. Daoud and Olivier Latry},
year = {2014},
doi = {10.1016/j.microrel.2014.07.131},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.131},
researchr = {https://researchr.org/publication/BelaidGDL14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {1851-1855},
}