Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests

M. A. Belaïd, K. Ketata, M. Gares, K. Mourgues, M. Masmoudi, J. Marcon. Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests. Microelectronics Reliability, 47(1):59-64, 2007. [doi]

Abstract

Abstract is missing.